T85.03 Leakage of ventricular intracranial (communicating) shunt
Non-billable header ICD10CM Release FY2026
Version history
| Release | Valid from | Valid to | Description | Billable |
|---|---|---|---|---|
| FY2026 | 2025-10-01 | current | Leakage of ventricular intracranial (communicating) shunt | no |
Related codes in T85
- T85 Complications of other internal prosthetic devices, implants and grafts
- T85.0 Mechanical complication of ventricular intracranial (communicating) shunt
- T85.01 Breakdown (mechanical) of ventricular intracranial (communicating) shunt
- T85.01XA Breakdown (mechanical) of ventricular intracranial (communicating) shunt, initial encounter
- T85.01XD Breakdown (mechanical) of ventricular intracranial (communicating) shunt, subsequent encounter
- T85.01XS Breakdown (mechanical) of ventricular intracranial (communicating) shunt, sequela
- T85.02 Displacement of ventricular intracranial (communicating) shunt
- T85.02XA Displacement of ventricular intracranial (communicating) shunt, initial encounter
- T85.02XD Displacement of ventricular intracranial (communicating) shunt, subsequent encounter
- T85.02XS Displacement of ventricular intracranial (communicating) shunt, sequela
- T85.03XA Leakage of ventricular intracranial (communicating) shunt, initial encounter
- T85.03XD Leakage of ventricular intracranial (communicating) shunt, subsequent encounter
- T85.03XS Leakage of ventricular intracranial (communicating) shunt, sequela
- T85.09 Other mechanical complication of ventricular intracranial (communicating) shunt
- T85.09XA Other mechanical complication of ventricular intracranial (communicating) shunt, initial encounter
- T85.09XD Other mechanical complication of ventricular intracranial (communicating) shunt, subsequent encounter
- T85.09XS Other mechanical complication of ventricular intracranial (communicating) shunt, sequela
- T85.1 Mechanical complication of implanted electronic stimulator of nervous system
- T85.11 Breakdown (mechanical) of implanted electronic stimulator of nervous system
- T85.110 Breakdown (mechanical) of implanted electronic neurostimulator of brain electrode (lead)